Characterisation of Radiation Damage by Transmission Electron Microscopy
Jenkins, M.L (University of Oxford, Kirk, M.A (Argonne National Laboratory
Description
Details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. This book also focuses on the methods used to characterize small point-defect clusters, such as dislocation loops.
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