Fundamentals of Electromigration-Aware Integrated Circuit Design
Lienig, Jens, Thiele, Matthias
Description
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
I have a question about the book:
‘Fundamentals of Electromigration-Aware Integrated Circuit Design - Lienig, Jens, Thiele, Matthias’.
Fill in the form below.
We will respond as fast as possible.
