Nanometrology Using Transmission Electron Microscopy

Vlad Stolojan

Description

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
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Writer
Vlad Stolojan
Title
Nanometrology Using Transmission Electron Microscopy
Publisher
Morgan & Claypool Publishers
Year
2015
Language
English
Pages
85
Weight
159 gr
EAN
9781681740560
Dimensions
254 x 178 x 6 mm
Binding format
Paperback

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Categories

Boekstra