Secondary Ion Mass Spectrometry

Applications for Depth Profiling and Surface Characterization

Description

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
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Writer
Stevie, Fred
Title
Secondary Ion Mass Spectrometry
Publisher
Momentum Press
Year
2015
Language
English
Pages
150
Weight
413 gr
EAN
9781606505885
Dimensions
235 x 152 x 19 mm
Binding format
Paperback

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Categories

Boekstra