Topics in Electron Diffraction and Microscopy of Materials

Description

Offers an overview of applications for selected electron microscope techniques that have become widespread in their use for furthering our understanding of how materials behave. This work discusses topics including weak-beam techniques for problem solving, defect structures and dislocation interactions, and atomic level imaging applications.
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Gebonden
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Writer
Title
Topics in Electron Diffraction and Microscopy of Materials
Publisher
Taylor & Francis Ltd
Year
1999
Language
English
Pages
208
EAN
9780750305389
Binding format
Gebonden

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Categories

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