Digital Integrated Circuit Testing from a Quality Perspective

Hnatek, Eugene R.

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Writer
Hnatek, Eugene R.
Title
Digital Integrated Circuit Testing from a Quality Perspective
Publisher
Springer US, New York, N.Y.
Year
1993
Language
English
Pages
194
Weight
476 gr
EAN
9780442006433
Dimensions
235 x 155 x 15 mm
Binding format
Hardback

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Boekstra