Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Echlin, Patrick
Description
The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
I have a question about the book:
‘Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis - Echlin, Patrick’.
Fill in the form below.
We will respond as fast as possible.
